Rohde & Schwarz
Precise measurements of fast switching signals
Rohde & Schwarz has developed the isolated probe system 'RT-Ziso', which enables accurate measurements of fast switching signals, especially in environments with high common-mode voltages and currents.
The RT-ZISO combines accuracy, sensitivity, dynamic range and bandwidth for novel power electronics designs based on SiC and GaN wide bandgap (WBG) semiconductors. It enables precise differential measurements of up to ±3 kV on reference voltages of ±60 kV with a rise time of < 450 ps and suppresses fast common mode signals that can distort and interfere with accurate measurements. Its power-over-fiber architecture galvanically isolates the device under test from the test setup and, according to Rohde & Schwarz, achieves a significantly higher common mode rejection ratio (CMRR) than conventional differential probes. Key features include bandwidth options from 100 MHz to 1 GHz (expandable), a CMRR of > 90 dB (> 30 000:1) at 1 GHz, an input and offset range of ±3 kV, a common mode range of ±60 kV and a sensitive input range of ±10 mV.
The isolated probe complements the manufacturer's oscilloscope portfolio. In the next-generation devices of the MXO series (MXO 4, MXO 5, MXO 5C), the probe enables measurements in both the time and frequency domain with the highest acquisition rate in the world, according to the company, thanks to the oscilloscope's hardware-based acceleration.
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