Micro-Epsilon
3D surface inspection and defect detection
The '3D ReflectControl' sensors from Micro-Epsilon are used for surface inspection and defect detection on highly reflective and transparent surfaces.
The sensors use phase-measuring deflectometry to analyze reflective surfaces. A stripe pattern is projected onto the surface and its reflection is recorded by two cameras. The sensor, which can be integrated stationary or guided over the measurement object on a robot, uses the images to calculate a 3D point cloud of the surface structure. The 'RCS130-160 3D HLP' from Micro-Epsilon is specially optimized for measurement and inspection tasks in production lines and has a GigE Vision interface. As a result, it delivers GenICam-compliant data, which enables seamless integration into existing image processing systems. The high z-resolution in the nanometer range and the repeat accuracy of <1 µm ensure that the sensor outputs up to 5 million 3D data points.
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