National Instruments / NI Week 2016Building blocks of the Smart World
A total of 3100 developers from 58 countries once again made the pilgrimage to Austin/Texas at the beginning of August 2016 - for National Instruments' annual NI Week.
© National Instruments
The Digital Pattern Instrument provides important hardware and software features for the creation of intelligent semiconductor test systems. The PXI module for the digital test of semiconductor components offers manufacturers of RFICs, PMICs, MEMS components and mixed-signal ICs an alternative to the closed architectures of conventional automated semiconductor test systems.