© Micro-Epsilon
The
confocal displacement sensors from Micro-Epsilon can be used to measure multilayer transparent materials. The confocal chromatic sensors with multi-peak option from the confocalDT series can measure up to five layers by evaluating six measured values at the respective interfaces. To ensure that the layer thickness can be determined correctly, the refractive indices of the respective layer are obtained from a material database in the controller. In addition, the refractive index is corrected depending on the wavelength. The thickness is calibrated in the controller software using three refractive indices at the beginning, end and middle of the measuring range. The sensors are used, for example, in quality inspection and process control in the manufacture of safety glass, solar cells, flat screens and smartphone displays.
